Publicaciones en las que colabora con Juan Barbolla Sánchez (2)

2001

  1. Atomistic front-end process modelling: A powerful tool for deep-submicron device fabrication

    SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES 2001

1996

  1. Determination of three-dimensional deep level defect distribution by capacitance-voltage transient technique (CVTT)

    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995