Universitat de Barcelona-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2002

  1. Analysis of the white emission from ion beam synthesised layers by in-depth resolved scanning photoluminescence microscopy

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology

1997

  1. Phase stepping microscopy for layer thickness measurement in silicon-on-insulator structures

    Thin Solid Films, Vol. 311, Núm. 1-2, pp. 225-229