Consiglio Nazionale delle Ricerche-ko ikertzaileekin lankidetzan egindako argitalpenak (1)

2015

  1. Evidence of chlorine ion penetration in InP/InAsP quantum well structures during dry etching processes and effects of induced-defects on the electronic and structural behaviour

    Microelectronics Reliability, Vol. 55, Núm. 9-10, pp. 1750-1753