FAC CIENCIAS
Centro
Interuniversity Microelectronics Centre
Lovaina, BélgicaPublicaciones en colaboración con investigadores/as de Interuniversity Microelectronics Centre (3)
2021
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Standards for the Characterization of Endurance in Resistive Switching Devices
ACS Nano, Vol. 15, Núm. 11, pp. 17214-17231
2017
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Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs
Applied Physics Letters, Vol. 111, Núm. 4
2008
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Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices
Technical Digest - International Electron Devices Meeting, IEDM