Thomson Reuters-ko ikertzaileekin lankidetzan egindako argitalpenak (4)

2000

  1. Micro-photoluminescence mapping of packaging-induced stress distribution in high-power AlGaAs laser diodes

    Proceedings of SPIE - The International Society for Optical Engineering

1999

  1. Temperature distribution in power GaAs field effect transistors using spatially resolved photoluminescence mapping

    Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA