ESCUELA DE INGENIERIAS INDUSTRIALES
Ikastegia
Russian Academy of Sciences
Moscú, RusiaRussian Academy of Sciences-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
1998
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Characterization of the new type of structural defects in Si by the scanning optical and electron beam techniques
DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997