ESCUELA DE INGENIERIAS INDUSTRIALES
Centro
Instituto de Microelectrónica de Barcelona
Barcelona, EspañaPublicaciones en colaboración con investigadores/as de Instituto de Microelectrónica de Barcelona (7)
2023
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CONTROLLING DOPING PROFILES OF SILICON NANOWIRES FOR QUANTUM COMPUTING AND PHOTOVOLTAICS USING MICRO-RAMAN SPECTROSCOPY
Acta Microscopica, Vol. 32, Núm. 2, pp. 8-9
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Technology Development for Exploring Novel Concepts in Semiconductor Qubits
14th Spanish Conference on Electron Devices, CDE 2023 - Proceedings
2022
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Effect of Dielectric Thickness on Resistive Switching Polarity in TiN/Ti/HfO2/Pt Stacks
Electronics (Switzerland), Vol. 11, Núm. 3
2021
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Semiempirical Memdiode Model for Resistive Switching Devices in Dynamic Regimes
Proceedings of the 2021 13th Spanish Conference on Electron Devices, CDE 2021
2013
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2 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O 3, HfO2 and nanolaminated dielectrics
Solid-State Electronics, Vol. 79, pp. 65-74
2011
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Electrical characteristics of metal-insulator-semiconductor structures with atomic layer deposited Al2 O3, HfO2, and nanolaminates on different silicon substrates
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
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Negative-resistance effect in Al2O3 based and nanolaminated MIS structures
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011