Jorge Francisco Suñe Tarruella-rekin lankidetzan egindako argitalpenak (3)

2024

  1. Neuromorphic Technology Insights in Spain

    Proceedings of the IEEE Conference on Nanotechnology

2021

  1. Standards for the Characterization of Endurance in Resistive Switching Devices

    ACS Nano, Vol. 15, Núm. 11, pp. 17214-17231

2014

  1. Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors

    Microelectronics Reliability