Jorge Francisco Suñe Tarruella-rekin lankidetzan egindako argitalpenak (2)

2021

  1. Standards for the Characterization of Endurance in Resistive Switching Devices

    ACS Nano, Vol. 15, Núm. 11, pp. 17214-17231

2014

  1. Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors

    Microelectronics Reliability