M.C Acero-rekin lankidetzan egindako argitalpenak (2)

2018

  1. Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications

    Journal of Electronic Materials

2017

  1. Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structures

    2017 Spanish Conference on Electron Devices, CDE 2017