Consejo Superior de Investigaciones Científicas-ko ikertzaileekin lankidetzan egindako argitalpenak (3)

2018

  1. Analysis and control of the intermediate memory states of RRAM devices by means of admittance parameters

    Journal of Applied Physics, Vol. 124, Núm. 15

2017

  1. A physically based model to describe resistive switching in different RRAM technologies

    2017 Spanish Conference on Electron Devices, CDE 2017

1994

  1. A STUDY OF CHANNELING AND INDUCED DAMAGE IN BORON-IMPLANTED SILICON

    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES