Kongressbeiträge (14) Publikationen, an denen Forscher/innen teilgenommen haben

1996

  1. A dictionary-based neural network scheme for on-line handwriting recognition

    HANDWRITING AND DRAWING RESEARCH

  2. A new neuro-fuzzy system for logical labeling of documents

    Proceedings - International Conference on Pattern Recognition

  3. Approach for determining bidirectional reflectance parameters from range and brightness data

    IEEE International Conference on Image Processing

  4. Atomic scale simulations of arsenic ion implantation and annealing in silicon

    Materials Research Society Symposium - Proceedings

  5. Brilliance and flux reduction in imperfect inclined crystals

    Review of Scientific Instruments

  6. Crystal diffraction lens telescope for focusing nuclear gamma rays

    Proceedings of SPIE - The International Society for Optical Engineering

  7. Crystal diffraction telescopes for nuclear astrophysics

    Proceedings of SPIE - The International Society for Optical Engineering

  8. Determination of three-dimensional deep level defect distribution by capacitance-voltage transient technique (CVTT)

    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995

  9. Experimental results with cryogenically cooled, thin, silicon crystal x-ray monochromators on high-heat-flux beamlines

    Proceedings of SPIE - The International Society for Optical Engineering

  10. Further tests on liquid‐nitrogen‐cooled, thin silicon‐crystal monochromators using a focused wiggler synchrotron beam

    Review of Scientific Instruments

  11. Hypothesis testing for coarse region estimation and stable point determination applied to Markovian texture segmentation

    IEEE International Conference on Image Processing

  12. Molecular dynamics studies of the ion beam induced crystallization in silicon

    Materials Research Society Symposium - Proceedings

  13. Neural network architecture for automatic chromosome analysis

    Proceedings of SPIE - The International Society for Optical Engineering

  14. Surface effects during ion beam processing of materials

    Materials Research Society Symposium - Proceedings