Influence of refilling effects on deep-level transient spectroscopy measurements in Se-doped AlxGa1-xAs

  1. Enríquez, L.
  2. Dueñas, S.
  3. Barbolla, J.
  4. Izpura, I.
  5. Muñoz, E.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 1992

Volume: 72

Issue: 2

Pages: 525-530

Type: Article

DOI: 10.1063/1.351883 GOOGLE SCHOLAR
Data source: Scopus