Homogeneity of Fe-DOPED InP wafers using optical microprobes
- Sanz, L.F.
- Gonzalez, M.A.
- Avella, M.
- Alvarez, A.
- Jimenez, J.
- Fornari, R.
ISSN: 1662-9752, 0255-5476
Year of publication: 1997
Volume: 258-263
Issue: PART 2
Pages: 825-830
Type: Article