Homogeneity of Fe-DOPED InP wafers using optical microprobes

  1. Sanz, L.F.
  2. Gonzalez, M.A.
  3. Avella, M.
  4. Alvarez, A.
  5. Jimenez, J.
  6. Fornari, R.
Collection de livres:
Materials Science Forum

ISSN: 1662-9752,  0255-5476

Année de publication: 1997

Volumen: 258-263

Número: PART 2

Pages: 825-830

Type: Article

DOI: 10.4028/WWW.SCIENTIFIC.NET/MSF.258-263.825 GOOGLE SCHOLAR
La source de données: Scopus