Atomistic modeling of point and extended defects in crystalline materials
- Jaraiz, Martin
- Pelaz, Lourdes
- Rubio, Emiliano
- Barbolla, Juan
- Gilmer, George H.
- Eaglesham, David J.
- Gossmann, Hans J.
- Poate, John M.
ISSN: 0272-9172
Année de publication: 1998
Volumen: 532
Pages: 43-53
Type: Communication dans un congrès
