Predictive simulation of advanced nano-CMOS devices based on kMC process simulation
- Mok, K.R.C.
- Colombeau, B.
- Benistant, F.
- Teo, R.S.
- Yeong, S.H.
- Yang, B.
- Jaraiz, M.
- Chu, S.-F.S.
ISSN: 0018-9383
Année de publication: 2007
Volumen: 54
Número: 9
Pages: 2155-2163
Type: Article