Bragg-Fresnel optics for hard x-ray microscopy: Development of fabrication process and x-ray characterization at the Advanced Photon Source

  1. Li, Y.
  2. Wong, G.C.L.
  3. Safinya, C.R.
  4. Caine, E.
  5. Hu, E.L.
  6. Haeffner, D.
  7. Fernandez, P.
  8. Yun, W.
Revista:
Review of Scientific Instruments

ISSN: 0034-6748

Any de publicació: 1998

Volum: 69

Número: 8

Pàgines: 2844-2848

Tipus: Article

DOI: 10.1063/1.1149022 GOOGLE SCHOLAR
Font de les dades: Scopus