Bragg-Fresnel optics for hard x-ray microscopy: Development of fabrication process and x-ray characterization at the Advanced Photon Source

  1. Li, Y.
  2. Wong, G.C.L.
  3. Safinya, C.R.
  4. Caine, E.
  5. Hu, E.L.
  6. Haeffner, D.
  7. Fernandez, P.
  8. Yun, W.
Zeitschrift:
Review of Scientific Instruments

ISSN: 0034-6748

Datum der Publikation: 1998

Ausgabe: 69

Nummer: 8

Seiten: 2844-2848

Art: Artikel

DOI: 10.1063/1.1149022 GOOGLE SCHOLAR