Bragg-Fresnel optics for hard x-ray microscopy: Development of fabrication process and x-ray characterization at the Advanced Photon Source
- Li, Y.
- Wong, G.C.L.
- Safinya, C.R.
- Caine, E.
- Hu, E.L.
- Haeffner, D.
- Fernandez, P.
- Yun, W.
ISSN: 0034-6748
Datum der Publikation: 1998
Ausgabe: 69
Nummer: 8
Seiten: 2844-2848
Art: Artikel