Bragg-Fresnel optics for hard x-ray microscopy: Development of fabrication process and x-ray characterization at the Advanced Photon Source

  1. Li, Y.
  2. Wong, G.C.L.
  3. Safinya, C.R.
  4. Caine, E.
  5. Hu, E.L.
  6. Haeffner, D.
  7. Fernandez, P.
  8. Yun, W.
Revista:
Review of Scientific Instruments

ISSN: 0034-6748

Ano de publicación: 1998

Volume: 69

Número: 8

Páxinas: 2844-2848

Tipo: Artigo

DOI: 10.1063/1.1149022 GOOGLE SCHOLAR