Antonio Tejero del Caz-rekin lankidetzan egindako argitalpenak (6)

2016

  1. Defect recognition by means of light and electron probe techniques for the characterization of mc-Si wafers and solar cells

    Superlattices and Microstructures, Vol. 99, pp. 45-53

2014

  1. Analysis of the reduction of tensile stress by post-growth annealing methods in multicrystalline silicon wafers produced by the RST process

    Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 11, Núm. 11-12, pp. 1640-1643

  2. Raman study of multicrystalline silicon wafers produced by the RST process

    Acta Physica Polonica A

  3. Residual strain and electrical activity of defects in multicrystalline silicon solar cells

    Acta Physica Polonica A

2013

  1. Low-cost system for full-wafer photoluminescence characterization of photovoltaic silicon

    Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013

  2. Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques

    Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013