LUIS ALBERTO
MARQUES CUESTA
CATEDRATICOS DE UNIVERSIDAD
RAY
DUFFY
Publications dans lesquelles il/elle collabore avec RAY DUFFY (11)
2012
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Molecular dynamics simulation of the regrowth of nanometric multigate Si devices
Journal of Applied Physics, Vol. 111, Núm. 3
2011
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The curious case of thin-body Ge crystallization
Applied Physics Letters, Vol. 99, Núm. 13
2010
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Simulation of p-n junctions: Present and future challenges for technologies beyond 32 nm
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 28, Núm. 1, pp. C1A1-C1A6
2009
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Atomistic process modeling based on kinetic Monte Carlo and molecular dynamics for optimization of advanced devices
Technical Digest - International Electron Devices Meeting, IEDM
2008
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Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices
Technical Digest - International Electron Devices Meeting, IEDM
2006
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Physical insight into boron activation and redistribution during annealing after low-temperature solid phase epitaxial regrowth
Applied Physics Letters, Vol. 88, Núm. 19
2005
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Atomistic analysis of the evolution of boron activation during annealing in crystalline and preamorphized silicon
Journal of Applied Physics, Vol. 97, Núm. 10
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Boron redistribution in pre-amorphized Si during thermal annealing
2005 Spanish Conference on Electron Devices, Proceedings
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Role of silicon interstitials in boron cluster dissolution
Applied Physics Letters, Vol. 86, Núm. 3, pp. 1-3
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Simulation analysis of boron pocket deactivation in NMOS transistors with SPER junctions
2005 Spanish Conference on Electron Devices, Proceedings
2004
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The role of silicon interstitials in the deactivation and reactivation of high concentration boron profiles
Materials Science and Engineering B: Solid-State Materials for Advanced Technology