Centro
ESCUELA DE INGENIERIA INFORMATICA (VA)
Artículos (3) Publicaciones en las que ha participado algún/a investigador/a
1990
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Characterization of the EL2 center in GaAs by optical admittance spectroscopy
Journal of Applied Physics, Vol. 67, Núm. 10, pp. 6309-6314
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Interface state density measurement in MOS structures by analysis of the thermally stimulated conductance
Solid State Electronics, Vol. 33, Núm. 8, pp. 987-992
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Rie-induced damage in MOS structures
Solid State Electronics, Vol. 33, Núm. 11, pp. 1419-1423