Artículos (13) Publicaciones en las que ha participado algún/a investigador/a

1997

  1. Analysis of large impurity atmospheres at dislocations and associated point defect reactions in differently n-doped GaAs crystals

    Journal de Physique III, Vol. 7, Núm. 12, pp. 2339-2360

  2. Annealing and irradiation induced infrared luminescence of Bi2Sr2CaCu2Ox ceramics

    Physica Status Solidi (A) Applied Research, Vol. 159, Núm. 2, pp. 535-541

  3. Dynamic mechanical properties of polyolefin foams studied by DMA techniques

    Polymer Engineering and Science, Vol. 37, Núm. 6, pp. 959-965

  4. Homogeneity of Fe-DOPED InP wafers using optical microprobes

    Materials Science Forum, Vol. 258-263, Núm. PART 2, pp. 825-830

  5. Homogeneity of thermally annealed Fe-doped InP wafers

    Materials Science and Engineering B, Vol. 44, Núm. 1-3, pp. 233-237

  6. On the defect structures in Te-doped GaAs

    Solid State Phenomena, Vol. 57-58, pp. 425-430

  7. Phase stepping microscopy for layer thickness measurement in silicon-on-insulator structures

    Thin Solid Films, Vol. 311, Núm. 1-2, pp. 225-229

  8. Raman microstructural analysis of silicon-on-insulator formed by high dose oxygen ion implantation: As-implanted structures

    Journal of Applied Physics, Vol. 82, Núm. 8, pp. 3730-3735

  9. Small angle X-ray reflectivity study of Langmuir-Blodgett films of a peripherally substituted zinc phthalocyanine

    Materials Science and Engineering C, Vol. 5, Núm. 1, pp. 59-60

  10. Supercooling and structural relaxation in amorphous Ge films under pulsed laser irradiation

    Journal of Applied Physics, Vol. 82, Núm. 1, pp. 236-242

  11. Temperature dependence of the photoquenching of EL2 in semi-insulating GaAs

    Applied Physics Letters, Vol. 70, Núm. 23, pp. 3131-3133

  12. Thermal conductivity of physically crosslinked closed cell polyolefin foams

    Polymer Testing, Vol. 16, Núm. 3, pp. 287-298

  13. Uniformity and physical properties of semi-insulating Fe-doped InP after wafer or ingot annealing

    Journal of Applied Physics, Vol. 82, Núm. 8, pp. 3836-3845