Departamento
Electricidad y Electrónica
Publicaciones (25) Publicaciones en las que ha participado algún/a investigador/a
2000
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An approach to the magnetic disaccommodation in Ti-substituted Ba–W hexaferrites
Journal of Applied Physics
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Atomistic modeling of complex silicon processing scenarios
Materials Research Society Symposium - Proceedings
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Dominant iron gettering mechanism in p/p+ silicon wafers
Applied Physics Letters, Vol. 77, Núm. 2, pp. 241-243
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Dose, energy, and ion species dependence of the effective plus factor for transient enhanced diffusion
Journal of the Electrochemical Society, Vol. 147, Núm. 9, pp. 3494-3501
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Electrical characteristics of anodic tantalum pentoxide thin films under thermal stress
Microelectronics Reliability, Vol. 40, Núm. 4-5, pp. 659-662
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Electrical characterization of low nitrogen content plasma deposited and rapid thermal annealed Al/SiNx:H/InP metal-insulator-semiconductor structures
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 39, Núm. 11, pp. 6212-6215
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Evaluation of vacancies and interstitials by thermogravimetry
Thermochimica Acta, Vol. 348, Núm. 1-2, pp. 91-96
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Haar MRTD wave propagation through isotropic plasmas
Annual Review of Progress in Applied Computational Electromagnetics
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Identification of parameters in multilayer media
Digests of the Intermag Conference
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Identification of parameters in multilayer media
Digests of the Intermag Conference, pp. FR-1
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Identification of parameters in multilayer media
IEEE Transactions on Magnetics, Vol. 36, Núm. 4 PART 1, pp. 1267-1271
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Identification of parameters in multilayer media
IEEE Transactions on Magnetics, Vol. 36, Núm. 4 I, pp. 1272-1275
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Improving numerical simulations of Preisach models for accuracy and speed
Digests of the Intermag Conference
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Improving numerical simulations of Preisach models for accuracy and speed
IEEE Transactions on Magnetics
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Interface quality study of ECR-deposited and rapid thermal annealed silicon nitride A1/SiNx:H/InP and A1/SiNx:H/ in0.53Ga0.47As structures by DLTS and conductance transient techniques
Microelectronics Reliability, Vol. 40, Núm. 4-5, pp. 845-848
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Kinetic Monte Carlo simulations: An accurate bridge between ab initio calculations and standard process experimental data
Materials Science in Semiconductor Processing, Vol. 3, Núm. 1-2, pp. 59-63
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Micromagnetic analysis of recording processes in periodic antidot arrays: Interaction between adjacent bits
Journal of Applied Physics, Vol. 87, Núm. 9 II, pp. 5645-5647
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Micromagnetic study of lithographically defined non-magnetic periodic nanostructures in magnetic thin films
Physica B: Condensed Matter, Vol. 275, Núm. 1-3, pp. 59-64
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Multi-resolution 2D-TLM technique using Haar wavelets
IEEE MTT-S International Microwave Symposium Digest, Vol. 1, pp. 243-246
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Simulation of defects and diffusion phenomena in silicon
MRS Bulletin, Vol. 25, Núm. 6, pp. 45-50