Artikuluak (4) Ikertzaileren baten partaidetza izan duten argitalpenak

1990

  1. Characterization of the EL2 center in GaAs by optical admittance spectroscopy

    Journal of Applied Physics, Vol. 67, Núm. 10, pp. 6309-6314

  2. Interface state density measurement in MOS structures by analysis of the thermally stimulated conductance

    Solid State Electronics, Vol. 33, Núm. 8, pp. 987-992

  3. Rie-induced damage in MOS structures

    Solid State Electronics, Vol. 33, Núm. 11, pp. 1419-1423

  4. Ring inversion in tetrahydrothiophen-3-one. A microwave study

    Journal of the Chemical Society, Faraday Transactions, Vol. 86, Núm. 1, pp. 5-10