MicroRaman study of crystallographic defects in SiC crystals

  1. Martín, E.
  2. Jiménez, J.
  3. Chafai, M.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 1998

Volume: 42

Issue: 12

Pages: 2309-2314

Type: Article

DOI: 10.1016/S0038-1101(98)00231-7 GOOGLE SCHOLAR
Data source: Scopus