Optical characterization of GaAs/Si layers grown by the conformal method (confined lateral epitaxial growth)
- Ardila, A.M.
- Martinez, O.
- Avella, M.
- Jiménez, J.
- Gil-Lafon, E.
- Gérard, B.
ISSN: 0884-2914
Year of publication: 2002
Volume: 17
Issue: 6
Pages: 1341-1349
Type: Article