Optical characterization of GaAs/Si layers grown by the conformal method (confined lateral epitaxial growth)

  1. Ardila, A.M.
  2. Martinez, O.
  3. Avella, M.
  4. Jiménez, J.
  5. Gil-Lafon, E.
  6. Gérard, B.
Revue:
Journal of Materials Research

ISSN: 0884-2914

Année de publication: 2002

Volumen: 17

Número: 6

Pages: 1341-1349

Type: Article

DOI: 10.1557/JMR.2002.0200 GOOGLE SCHOLAR