Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes
- Garcia, H.
- Castan, H.
- Duenas, S.
- Bailon, L.
- Feijoo, P.C.
- Pampillon, M.A.
- Andres, E.S.
Konferenzberichte:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
ISBN: 9781467346689
Datum der Publikation: 2013
Seiten: 285-288
Art: Konferenz-Beitrag