Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes

  1. Garcia, H.
  2. Castan, H.
  3. Duenas, S.
  4. Bailon, L.
  5. Feijoo, P.C.
  6. Pampillon, M.A.
  7. Andres, E.S.
Actas:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013

ISBN: 9781467346689

Ano de publicación: 2013

Páxinas: 285-288

Tipo: Achega congreso

DOI: 10.1109/CDE.2013.6481398 GOOGLE SCHOLAR
Fonte de datos: Scopus