Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes

  1. Garcia, H.
  2. Castan, H.
  3. Duenas, S.
  4. Bailon, L.
  5. Feijoo, P.C.
  6. Pampillon, M.A.
  7. Andres, E.S.
Proceedings:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013

ISBN: 9781467346689

Year of publication: 2013

Pages: 285-288

Type: Conference paper

DOI: 10.1109/CDE.2013.6481398 GOOGLE SCHOLAR
Data source: Scopus