Publicaciones en las que colabora con ALFREDO TORRES PÉREZ (8)

2001

  1. MicroRaman study of bulk inclusions in SiC crystals

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 80, Núm. 1-3, pp. 366-369

  2. Raman scattering from LO phonon-plasmon coupled modes and Hall-effect in n-type silicon carbide 4H-SiC

    Journal of Applied Physics, Vol. 90, Núm. 10, pp. 5211-5215

1998

  1. Temperature dependence of the Raman spectrum of ternary alloys

    Physical Review B - Condensed Matter and Materials Physics, Vol. 58, Núm. 16, pp. 10463-10469

1995

  1. Raman microprobe analysis of patterned high Tc superconductor (YBCO) thin films

    Materials Research Bulletin, Vol. 30, Núm. 6, pp. 771-778

1994

  1. MicroRaman analysis of twin lamellae in undoped LEC InP

    Journal of Materials Science: Materials in Electronics, Vol. 5, Núm. 6, pp. 315-320

1993

  1. Raman microprobe: a diagnostic tool for processed silicon. Analysis of microindented silicon

    Journal of Materials Science: Materials in Electronics, Vol. 4, Núm. 4, pp. 271-277

1992

  1. Raman assessment of InP wafers

    LEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels - 4th International Conference on Indium Phosphide and Related Materials, IPRM 1992

  2. Raman microprobe analysis of chemically revealed extended defects in GaAs

    Semiconductor Science and Technology, Vol. 7, Núm. 1 A