Alejandro Pérez Rodríguez-rekin lankidetzan egindako argitalpenak (4)

1997

  1. Phase stepping microscopy for layer thickness measurement in silicon-on-insulator structures

    Thin Solid Films, Vol. 311, Núm. 1-2, pp. 225-229

  2. Raman microstructural analysis of silicon-on-insulator formed by high dose oxygen ion implantation: As-implanted structures

    Journal of Applied Physics, Vol. 82, Núm. 8, pp. 3730-3735

1994

  1. Optical characterisation of SIMOX structures formed by successive implantation and annealing

    Nuclear Inst. and Methods in Physics Research, B, Vol. 84, Núm. 2, pp. 275-280

1992

  1. In depth resolved analysis of SIMOX materials by optical characterization techniques

    1991 IEEE International SOI Conference Proceedings