Publicaciones en las que colabora con Christian Belouet (6)

2014

  1. Analysis of the reduction of tensile stress by post-growth annealing methods in multicrystalline silicon wafers produced by the RST process

    Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 11, Núm. 11-12, pp. 1640-1643

  2. Raman study of multicrystalline silicon wafers produced by the RST process

    Acta Physica Polonica A

2000

  1. Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films

    Journal of Materials Research, Vol. 15, Núm. 5, pp. 1069-1075

1996

  1. A microraman study of the structural properties of PLD high Tc superconducting thin films

    Physica C: Superconductivity and its Applications, Vol. 270, Núm. 1-2, pp. 144-154

  2. Oxygen content of YBaCuO thin films

    Physica C: Superconductivity and its Applications, Vol. 256, Núm. 3-4, pp. 291-297

  3. Study of grain boundaries in YBCO thin films using microraman spectroscopy

    Materials Research Society Symposium - Proceedings