Publicaciones en las que colabora con Tomas Rodríguez Rodriguez (7)

2011

  1. Si and SixGe1-x NWs studied by Raman spectroscopy

    Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 8, Núm. 4, pp. 1307-1310

2010

  1. Micro-Raman spectroscopy of Si nanowires: Influence of diameter and temperature

    Applied Physics Letters, Vol. 96, Núm. 1

  2. Raman spectroscopy study of group IV semiconductor nanowires

    Physics Procedia

2008

  1. Nanostructures with group IV nanocrystals obtained by LPCVD and thermal annealing of SiGeO layers

    Materials Research Society Symposium Proceedings

  2. Raman spectroscopy of group IV nanostructured semiconductors: Influence of size and temperature

    Materials Research Society Symposium Proceedings

2001

  1. Nucleation site location its influence on the microstructure of solid-phase crystallized SiGe films

    Journal of Applied Physics, Vol. 90, Núm. 5, pp. 2544-2552

2000

  1. Analysis of the crystallization kinetics and microstructure of polycrystalline SiGe films by optical techniques

    Materials Research Society Symposium - Proceedings