Publicaciones en colaboración con investigadores/as de Instituto de Microelectrónica de Barcelona (4)

2022

  1. Atomistic simulations of acceptor removal in p-type Si irradiated with neutrons

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 512, pp. 42-48

  2. Microscopic origin of the acceptor removal in neutron-irradiated Si detectors - An atomistic simulation study

    Acta Materialia, Vol. 241

2018

  1. I ON Degradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

2007

  1. Boron electrical activation in SOI compared to bulk Si substrates

    2007 Spanish Conference on Electron Devices, Proceedings