ETS INGENIEROS TELECOMUNICACION

1997

1. Advanced Photon Source undulator beamline tests of a contact-cooled silicon u-shaped monochromator

   Proceedings of SPIE - The International Society for Optical Engineering

2. Analytical parametrization of a 2D real propagation space in terms of complex electromagnetic beams

   IEICE Transactions on Electronics, Vol. E80-C, Núm. 11, pp. 1434-1439

3. Application of TINA-C computing and service architecture concepts to the development of an advanced information brokerage service in the context of EC

   Telecommunications Information Networking Architecture, TINA, Conference Proceedings

4. Application of high-resolution X-ray diffractometry to the structural study of epitaxial multilayers on novel index surfaces

   Microelectronics Journal, Vol. 28, Núm. 8-10, pp. 777-784

5. Atomistic model of transient enhanced diffusion and clustering of boron in silicon

   Materials Research Society Symposium - Proceedings

6. B diffusion and clustering in ion implanted Si: The role of B cluster precursors

   Applied Physics Letters, Vol. 70, Núm. 17, pp. 2285-2287

7. Boron-Enhanced-Diffusion of boron: The limiting factor for ultra-shallow junctions

   Technical Digest - International Electron Devices Meeting, IEDM

8. Building digital libraries from paper documents, using ART based neuro-fuzzy systems

   Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

9. Charge accumulation effects in InGaAs/GaAs [111]oriented piezoelectric multiple quantum wells

   Microelectronics Journal, Vol. 28, Núm. 8-10, pp. 767-775

10. Deep levels in p+-n junctions fabricated by rapid thermal annealing of Mg or Mg/P implanted InP

    Journal of Applied Physics, Vol. 81, Núm. 7, pp. 3143-3150

11. Detailed electrical characterization of DX centers in Se-doped AlxGa1-xAs

    Journal of Applied Physics, Vol. 82, Núm. 9, pp. 4338-4345

12. Dose effects on amorphous silicon sputtering by argon ions: A molecular dynamics simulation

    Journal of Applied Physics, Vol. 81, Núm. 3, pp. 1488-1494

13. Experimental observation of conductance transients in Al/SiNx:H/Si metal-insulator-semiconductor structures

    Applied Physics Letters, Vol. 71, Núm. 6, pp. 826-828

14. FasBack: Matching-error based learning for automatic generation of fuzzy logic systems

    PROCEEDINGS OF THE SIXTH IEEE INTERNATIONAL CONFERENCE ON FUZZY SYSTEMS, VOLS I - III

15. FasBack: Matching-error based learning for automatic generation of fuzzy logic systems

    IEEE International Conference on Fuzzy Systems

16. Growth and characterization of (InSb)m(InP)n short period superlattices

    Applied Physics Letters, Vol. 70, Núm. 22, pp. 3017-3019

17. High-resolution X-ray diffraction characterisation of piezoelectric InGaAs/GaAs multiquantum wells and superlattices on (lll)B GaAs

    Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics, Vol. 19, Núm. 2-4, pp. 329-337

18. Industrial painting inspection using specular sharpness

    Proceedings of the International Conference on Recent Advances in 3-D Digital Imaging and Modeling

19. Molecular dynamics simulations of ion bombardment processes

    Materials Science and Technology, Vol. 13, Núm. 11, pp. 893-896

20. Observation of non-trigonal lattice distortion in pseudomorphic InGaAs/ GaAs superlattices grown on misoriented (111)B GaAs

    Journal of Applied Physics, Vol. 82, Núm. 7, pp. 3297-3305