Electrical characterization of a He ion implantation-induced deep level existing in p+n InP junctions
ISSN: 0021-8979
Year of publication: 1999
Volume: 85
Issue: 11
Pages: 7978-7980
Type: Article
ISSN: 0021-8979
Year of publication: 1999
Volume: 85
Issue: 11
Pages: 7978-7980
Type: Article