Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films

  1. Martínez, O.
  2. Jiménez, J.
  3. Chambonnet, D.
  4. Belouet, C.
Journal:
Journal of Materials Research

ISSN: 0884-2914

Year of publication: 2000

Volume: 15

Issue: 5

Pages: 1069-1075

Type: Article

DOI: 10.1557/JMR.2000.0154 GOOGLE SCHOLAR

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