Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films

  1. Martínez, O.
  2. Jiménez, J.
  3. Chambonnet, D.
  4. Belouet, C.
Revue:
Journal of Materials Research

ISSN: 0884-2914

Année de publication: 2000

Volumen: 15

Número: 5

Pages: 1069-1075

Type: Article

DOI: 10.1557/JMR.2000.0154 GOOGLE SCHOLAR

Objectifs de Développement Durable

La source de données: Scopus