An in situ transmission electron microscope study of the anomalous annealing of spatially isolated disordered zones in silicon

  1. Edmondson, P.D.
  2. Birtcher, R.C.
  3. Vishnyakov, V.M.
  4. Lopez, P.
  5. Pelaz, L.
  6. Marques, L.A.
  7. Donnelly, S.E.
Proceedings:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Year of publication: 2006

Volume: 26

Issue: 1

Pages: 284-287

Type: Conference paper

DOI: 10.1088/1742-6596/26/1/068 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus