An in situ transmission electron microscope study of the anomalous annealing of spatially isolated disordered zones in silicon

  1. Edmondson, P.D.
  2. Birtcher, R.C.
  3. Vishnyakov, V.M.
  4. Lopez, P.
  5. Pelaz, L.
  6. Marques, L.A.
  7. Donnelly, S.E.
Aktak:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Argitalpen urtea: 2006

Alea: 26

Zenbakia: 1

Orrialdeak: 284-287

Mota: Biltzar ekarpena

DOI: 10.1088/1742-6596/26/1/068 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus