Publicaciones en las que colabora con Alejandro Pérez Rodríguez (6)

2002

  1. Analysis of the white emission from ion beam synthesised layers by in-depth resolved scanning photoluminescence microscopy

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology

1997

  1. Phase stepping microscopy for layer thickness measurement in silicon-on-insulator structures

    Thin Solid Films, Vol. 311, Núm. 1-2, pp. 225-229

  2. Raman microstructural analysis of silicon-on-insulator formed by high dose oxygen ion implantation: As-implanted structures

    Journal of Applied Physics, Vol. 82, Núm. 8, pp. 3730-3735

1994

  1. Optical characterisation of SIMOX structures formed by successive implantation and annealing

    Nuclear Inst. and Methods in Physics Research, B, Vol. 84, Núm. 2, pp. 275-280

1992

  1. In depth resolved analysis of SIMOX materials by optical characterization techniques

    1991 IEEE International SOI Conference Proceedings

1991

  1. Raman scattering and photoluminescence analysis of silicon on insulator structures obtained by single and multiple oxygen implants

    Journal of Applied Physics, Vol. 70, Núm. 3, pp. 1678-1683