ALFREDO
TORRES PÉREZ
Forscher in der Zeit 2002-2002
Publikationen, an denen er mitarbeitet ALFREDO TORRES PÉREZ (53)
2019
-
A comparative analysis of the catastrophic degradation of AlGaAs/GaAs and AlGaAs/InGaAs laser diodes: Role of the strained QWs
Proceedings of SPIE - The International Society for Optical Engineering
2018
-
Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces
Optics Letters, Vol. 43, Núm. 15, pp. 3505-3508
-
Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Ar/Cl2/CH4 Plasma Chemistry
Journal of Electronic Materials
2017
-
About the impact of the materials properties in the catastrophic degradation of high power GaAs based laser diodes
Proceedings of SPIE - The International Society for Optical Engineering
-
Thermomechanical degradation of single and multiple quantum well AlGaAs/GaAs laser diodes
Microelectronics Reliability, Vol. 76-77, pp. 588-591
2016
-
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes
Microelectronics Reliability, Vol. 64, pp. 627-630
-
Defect formation during chlorine-based dry etching and their effects on the electronic and structural properties of InP/InAsP quantum wells
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 34, Núm. 4
-
GaAs/GaP quantum dots: Ensemble of direct and indirect heterostructures with room temperature optical emission
Applied Physics Letters, Vol. 108, Núm. 10
-
Sequential description of the catastrophic optical damage of high power laser diodes
Proceedings of SPIE - The International Society for Optical Engineering
2015
-
Enhanced signal micro-raman study of SiGe nanowires and SiGe/Si nanowire axial heterojunctions grown using Au and Ga-Au catalysts
Materials Research Society Symposium Proceedings
-
Evidence of chlorine ion penetration in InP/InAsP quantum well structures during dry etching processes and effects of induced-defects on the electronic and structural behaviour
Microelectronics Reliability, Vol. 55, Núm. 9-10, pp. 1750-1753
-
Mechanisms driving the catastrophic optical damage in high-power laser diodes
Proceedings of SPIE - The International Society for Optical Engineering
2014
-
Composition profiles in InP/InAsP quantum well structures under the effect of reactives gases during dry etching processes - Luminescence and SIMS
Conference Proceedings - International Conference on Indium Phosphide and Related Materials
-
Raman spectroscopy in group IV Nanowires and nanowire axial heterostructures
Materials Research Society Symposium Proceedings
-
Raman spectroscopy in group IV nanowires and nanowire axial heterostructures
Behavioral and Brain Sciences, Vol. 1659, Núm. 2
-
Raman spectrum of Si nanowires: Temperature and phonon confinement effects
Applied Physics A: Materials Science and Processing, Vol. 114, Núm. 4, pp. 1321-1331
2013
-
Interaction between a laser beam and semiconductor nanowires: Application to the Raman spectrum of Si nanowires
International Journal of Nanoparticles
-
Intermixing in InAsP/InP quantum wells induced by dry etching processes
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
-
Study of the temperature distribution in Si nanowires under microscopic laser beam excitation
Applied Physics A: Materials Science and Processing, Vol. 113, Núm. 1, pp. 167-176
2012
-
Microraman spectroscopy of Si nanowires: Influence of size
Materials Science Forum