Departamento
Electricidad y Electrónica
Artículos (11) Publicaciones en las que ha participado algún/a investigador/a
2004
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A 2D-TLM model for electromagnetic wave propagation in Tellegen media
Microwave and Optical Technology Letters, Vol. 40, Núm. 5, pp. 438-441
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Boron diffusion in amorphous silicon and the role of fluorine
Applied Physics Letters, Vol. 84, Núm. 21, pp. 4283-4285
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Conductance Transient Comparative Analysis of Electron-Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposited SiNx, SiC 2/SiNx and SiOxNy Dielectric Films on Silicon Substrates
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 43, Núm. 1, pp. 66-70
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Effect of growth temperature and postmetallization annealing on the interface and dielectric quality of atomic layer deposited HfO2 on p and n silicon
Journal of Applied Physics, Vol. 96, Núm. 3, pp. 1365-1372
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FDTD modeling of transient microwave signals in dispersive and lossy bi-isotropic media
IEEE Transactions on Microwave Theory and Techniques, Vol. 52, Núm. 3, pp. 773-784
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Ion implant simulations: Kinetic Monte Carlo annealing assessment of the dominant features
Applied Physics Letters, Vol. 84, Núm. 24, pp. 4962-4964
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Ion-beam-induced amorphization and recrystallization in silicon
Journal of Applied Physics, Vol. 96, Núm. 11, pp. 5947-5976
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Low-power pipeline ADC for wireless LANs
IEEE Journal of Solid-State Circuits, Vol. 39, Núm. 8, pp. 1338-1340
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Radiation-enhanced diffusion of Sb and B in silicon during implantation below 400 ° C
Physical Review B - Condensed Matter and Materials Physics, Vol. 69, Núm. 12
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Stable high-order delta-sigma digital-to-analog converters
IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 51, Núm. 1, pp. 200-205
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The electrical-interface quality of as-grown atomic-layer-deposited disordered HfO2 on p- and n-type silicon
Semiconductor Science and Technology, Vol. 19, Núm. 9, pp. 1141-1148