Aportaciones congreso (11) Publicaciones en las que ha participado algún/a investigador/a

2018

  1. I ON Degradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

  2. Resistive Switching Properties of Atomic Layer Deposited ZrO 2 -HfO 2 Thin Films

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

  3. Admittance memory cycles of Ta2O5-ZrO2-based RRAM devices

    2017 32nd Conference on Design of Circuits and Integrated Systems, DCIS 2017 - Proceedings

  4. Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications

    Journal of Electronic Materials

  5. Energy Levels of Defects Created in Silicon Supersaturated with Transition Metals

    Journal of Electronic Materials

  6. Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation

    Journal of Electronic Materials

  7. Memory maps: Reading RRAM devices without power consumption

    ECS Transactions

  8. Modeling SiGe Through Classical Molecular Dynamics Simulations: Chasing an Appropriate Empirical Potential

    Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

  9. Study of the influence of the dielectric composition of Al/Ti/ZrO2:Al2O3/TiN/Si/Al structures on the resistive switching behavior for memory applications

    ECS Transactions

  10. The Role of Defects in the Resistive Switching Behavior of Ta2O5-TiO2-Based Metal–Insulator–Metal (MIM) Devices for Memory Applications

    Journal of Electronic Materials

  11. W and X Photoluminescence Centers in Crystalline Si: Chasing Candidates at Atomic Level Through Multiscale Simulations

    Journal of Electronic Materials