PROYECTOS REGIONALES
Proiektua VA166A11-2
ESTUDIO ÓPTICO Y ELÉCTRICO DE DEFECTOS EN CÉLULAS SOLARES DE SILICIO MULTICRISTALINO Y SU RELACIÓN CON LA EFICIENCIA DE LAS MISMAS
Finantzatzailea:
JUNTA DE CASTILLA Y LEÓN -CONSEJERÍA DE EDUCACIÓN
date_range
Iraupena 2011(e)ko martxoa-(a)k 21-(e)tik 2013(e)ko abendua-(a)k 31-(e)ra izan da
(33 months)
Amaitu
euro
30.000,00 EUR
Autonomia-arlokoak. Izaera Publikoa-arekin.
Deialdi:
PROGRAMA DE APOYO A PROYECTOS DE INVESTIGACIÓN A INICIAR EN 2011
(JUNTA DE CASTILLA Y LEÓN -CONSEJERÍA DE EDUCACIÓN)
Azpiprograma:
CONVOCATORIA DE APOYO A PROYECTOS
Ikertzaileak
(10) proiektuarekin lotutako argitalpenak
Erakutsi tipologiaren arabera2016
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Defect recognition by means of light and electron probe techniques for the characterization of mc-Si wafers and solar cells
Superlattices and Microstructures
2014
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Raman study of multicrystalline silicon wafers produced by the RST process
Acta Physica Polonica A
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Fully porous GaN p-n junction diodes fabricated by chemical vapor deposition
ACS Applied Materials and Interfaces
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Epitaxial growth of (0001) oriented porous GaN layers by chemical vapour deposition
CrystEngComm
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Analysis of the reduction of tensile stress by post-growth annealing methods in multicrystalline silicon wafers produced by the RST process
Physica Status Solidi (C) Current Topics in Solid State Physics
2013
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Growth of CdS and CdTe films by close space vapour sublimation by using SiC resistive elements
CrystEngComm
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Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
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Modification of the properties of CdTe films grown by close space vapour sublimation for solar cell applications
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
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Trends in crystalline silicon growth for low cost and efficient photovoltaic cells
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
2012
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Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC
Journal of Materials Science