Física de la Materia Condensada, Cristalografía y Mineralogía
Departamento
Universitat de Barcelona
Barcelona, EspañaPublicaciones en colaboración con investigadores/as de Universitat de Barcelona (18)
2023
2020
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Layer-by-layer modification effects on a nanopore's inner surface of polycarbonate track-etched membranes
RSC Advances, Vol. 10, Núm. 59, pp. 35930-35940
2015
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Co-Assembly, spatiotemporal control and morphogenesis of a hybrid protein-peptide system
Nature Chemistry, Vol. 7, Núm. 11, pp. 897-904
2013
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Enhanced cell-material interactions through the biofunctionalization of polymeric surfaces with engineered peptides
Biomacromolecules, Vol. 14, Núm. 8, pp. 2690-2702
2012
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Luminescence studies of isolated ZnO nanowires grown by the vapour-liquid-solid method
Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 9, Núm. 7, pp. 1537-1539
2011
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Preparation and characterization of glutaraldehyde-cross-linked RGD-containing elastin-like polymer matrices
24th European Conference on Biomaterials - Annual Conference of the European Society for Biomaterials
2008
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Raman scattering and cathodoluminescence characterization of near lattice-matched InxAl1-xN epilayers
Semiconductor Science and Technology, Vol. 23, Núm. 10
2006
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Polypropylene/clay nanocomposites: Combined effects of clay treatment and compatibilizer polymers on the structure and properties
Journal of Applied Polymer Science, Vol. 102, Núm. 2, pp. 1213-1223
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Substrate influence on the high-temperature annealing behavior of GaN: Si vs. sapphire
Materials Research Society Symposium Proceedings
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The effect of substrate on high-temperature annealing of GaN epilayers: Si versus sapphire
Journal of Applied Physics, Vol. 100, Núm. 4
2002
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Analysis of the white emission from ion beam synthesised layers by in-depth resolved scanning photoluminescence microscopy
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
1997
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Phase stepping microscopy for layer thickness measurement in silicon-on-insulator structures
Thin Solid Films, Vol. 311, Núm. 1-2, pp. 225-229
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Raman microstructural analysis of silicon-on-insulator formed by high dose oxygen ion implantation: As-implanted structures
Journal of Applied Physics, Vol. 82, Núm. 8, pp. 3730-3735
1994
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Optical characterisation of SIMOX structures formed by successive implantation and annealing
Nuclear Inst. and Methods in Physics Research, B, Vol. 84, Núm. 2, pp. 275-280
1992
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In depth resolved analysis of SIMOX materials by optical characterization techniques
1991 IEEE International SOI Conference Proceedings
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Raman characterization of SOI-SIMOX structures
Materials Letters, Vol. 15, Núm. 1-2, pp. 122-126
1991
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Raman scattering and photoluminescence analysis of SOI/SIMOX structures obtained by sequential implantation and annealing correlated with cross sectional TEM
Nuclear Inst. and Methods in Physics Research, B, Vol. 55, Núm. 1-4, pp. 714-717
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Raman scattering and photoluminescence analysis of silicon on insulator structures obtained by single and multiple oxygen implants
Journal of Applied Physics, Vol. 70, Núm. 3, pp. 1678-1683