Electricidad y Electrónica

2007

1. Atomistic analysis of the annealing behavior of amorphous regions in silicon

   Journal of Applied Physics

2. Atomistic modeling and physical comprehension of the effects of implant dose rate on boron activation in pMOSFET S/D

   ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference

3. Atomistic modeling of defect diffusion in SiGe

   2007 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2007

4. Atomistic simulation of damage accumulation during shallow B and As implant into Si

   2007 Spanish Conference on Electron Devices, Proceedings

5. Boron electrical activation in SOI compared to bulk Si substrates

   2007 Spanish Conference on Electron Devices, Proceedings

6. Contactless technique for low-frequency measurement of resistivity in nonmagnetic conductive tubes

   IEEE Transactions on Instrumentation and Measurement

7. Current capabilities and future prospects of atomistic process simulation

   Technical Digest - International Electron Devices Meeting, IEDM

8. Electrical characterization of high-k dielectrics by means of flat-band voltage transient recording

   Materials Research Society Symposium Proceedings

9. Electron paramagnetic resonance of double perovskite Ba 2FeMoO6

   Physica Status Solidi (C) Current Topics in Solid State Physics

10. From point defects to dislocation loops: A comprehensive TCAD model for self-interstitial defects in silicon

    ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference

11. Molecular dynamics modeling of octadecaborane implantation into Si

    2007 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2007

12. Molecular dynamics simulation of octadecaborane implantation into silicon

    2007 Spanish Conference on Electron Devices, Proceedings

13. Molecular dynamics study of damage generation mechanisms in silicon at the low energy regime

    2007 Spanish Conference on Electron Devices, Proceedings

14. Physics based models for process optimization

    2007 Spanish Conference on Electron Devices, Proceedings

15. Predictive simulations and optimization of advanced ultra-shallow junction formation for nano-CMOS devices

    Extended Abstracts of the 7th International Workshop on Junction Technology, IWJT 2007

16. Some numerical aspects of an extension of the FDTD method to incorporate magnetized ferrites

    2007 Workshop on Computational Electromagnetics in Time-Domain, CEM-TD

17. Study of atomic layer deposited gadolinium oxide thin films on silicon

    Materials Research Society Symposium Proceedings